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| Genetics and Molecular Mapping of a High-Temperature Resistance Gene to Stripe Rust in Seeding-Stage in Winter Wheat Cultivar Lantian |
| MA Dong-fang, JING Jin-xue, HOU Dong-yuan, LI Qiang, ZHOU Xin-li, DU Jiu-yuan , LU Qing-lin |
1 State Key Laboratory of Crop Stress Biology for Arid Areas, College of Plant Protection, Northwest A&F University, Yangling 712100,P.R.China
2 Wheat Research Institute, Gansu Academy of Agricultural Sciences, Lanzhou 730070, P.R.China |
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摘要 Stripe rust, caused by Puccinia striiformis Westend. f. sp. tritici (Pst), is a severe foliar disease of common wheat (Triticum aestivum L.) in the world. Resistance is the best approach to control the disease. The winter wheat cultivar Lantian 1 has high-temperature resistance to stripe rust. To determing the gene(s) for the stripe rust resistance, Lantian 1 was crossed with Mingxian 169 (M169). Seedlings of the parents, and F1, F2 and F2-3 progenies were tested with races CYR32 of Pst under controlled greenhouse conditions. Lantian 1 has a single partially dominant gene conferred resistance to race CYR32, designated as YrLT1. Simple sequence repeat (SSR) techniques were used to identify molecular markers linked to YrLT1. A linkage group of five SSR markers was constructed for YrLT1 using 166 F2 plants. Based on the SSR marker consensus map and the position on wheat chromosome, the resistance gene was assigned on chromosome 2DL. Amplification of a set of nulli-tetrasomic Chinese Spring lines with SSR marker Xwmc797 confirmed that the resistance gene was located on the long arm of chromosome 2D. Because of its chromosomal location and the high-temperature resistance, this gene is different from previously described genes. The molecular map spanned 29.9 cM, and the genetic distance of two close markers Xbarc228 and Xcfd16 to resistance gene locus was 4.0 and 5.7 cM, respectively. The polymorphism rates of the flanking markers in 46 wheat lines were 2.1 and 2.1%, respectively; and the two markers in combination could distinguish the alleles at the resistance locus in 97.9% of tested genotypes. This new gene and flanking markers should be useful in developing wheat cultivars with high level and possible durable resistance to stripe rust.
Abstract Stripe rust, caused by Puccinia striiformis Westend. f. sp. tritici (Pst), is a severe foliar disease of common wheat (Triticum aestivum L.) in the world. Resistance is the best approach to control the disease. The winter wheat cultivar Lantian 1 has high-temperature resistance to stripe rust. To determing the gene(s) for the stripe rust resistance, Lantian 1 was crossed with Mingxian 169 (M169). Seedlings of the parents, and F1, F2 and F2-3 progenies were tested with races CYR32 of Pst under controlled greenhouse conditions. Lantian 1 has a single partially dominant gene conferred resistance to race CYR32, designated as YrLT1. Simple sequence repeat (SSR) techniques were used to identify molecular markers linked to YrLT1. A linkage group of five SSR markers was constructed for YrLT1 using 166 F2 plants. Based on the SSR marker consensus map and the position on wheat chromosome, the resistance gene was assigned on chromosome 2DL. Amplification of a set of nulli-tetrasomic Chinese Spring lines with SSR marker Xwmc797 confirmed that the resistance gene was located on the long arm of chromosome 2D. Because of its chromosomal location and the high-temperature resistance, this gene is different from previously described genes. The molecular map spanned 29.9 cM, and the genetic distance of two close markers Xbarc228 and Xcfd16 to resistance gene locus was 4.0 and 5.7 cM, respectively. The polymorphism rates of the flanking markers in 46 wheat lines were 2.1 and 2.1%, respectively; and the two markers in combination could distinguish the alleles at the resistance locus in 97.9% of tested genotypes. This new gene and flanking markers should be useful in developing wheat cultivars with high level and possible durable resistance to stripe rust.
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Received: 27 July 2012
Accepted:
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| Fund: The financial support of the 111 Project from the Ministry of Education of China (B07049), the Key Technologies R&D Program of China during the 11th Five-Year Plan period (2006BAD08A05) and the project of Toxicity Variation of Wheat Stripe Rust Pathogen and Demonstration of Integrated Management of Stripe Rust, China (200903035-02) are thankfully acknowledged. |
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Corresponding Authors:
Correspondence JING Jin-xue, Tel: +86-29-87092434, E-mail: jingjinxue@163.com
E-mail: jingjinxue@163.com
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| About author: MA Dong-fang, E-mail: madongfang1984@163.com |
Cite this article:
MA Dong-fang, JING Jin-xue, HOU Dong-yuan, LI Qiang, ZHOU Xin-li, DU Jiu-yuan , LU Qing-lin.
2013.
Genetics and Molecular Mapping of a High-Temperature Resistance Gene to Stripe Rust in Seeding-Stage in Winter Wheat Cultivar Lantian. Journal of Integrative Agriculture, 12(6): 1018-1025.
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