小麦抗叶锈基因Lr45的SCAR标记

doi:10.3864/j.issn.0578-1752.2009.01.015

Scientia Agricultura Sinica ›› 2009, Vol. 42 ›› Issue (1): 124-129 .doi: 10.3864/j.issn.0578-1752.2009.01.015

• PLANT PROTECTION • Previous Articles Next Articles

A SCAR Marker for Leaf Rust Resistance Gene Lr45

河北农业大学植物病理系，河北省农作物病虫害生物防治工程技术研究中心

Received:2008-01-22 Revised:2008-02-27 Online:2009-01-10 Published:2009-01-10
Contact: LIU Da-qun;YANG Wen-xiang

Abstract

Abstract:

【Objective】 The objective was to develop a SCAR(sequenced characterized amplified region) marker for wheat leaf rust resistance gene Lr45. 【Method】 Wheat leaf rust resistance near isogenic lines of TcLr45 and its susceptible control Thatcher were employed. PCR was carried out with the OPH20, which is a specific RAPD primer of rye. The amplified 1.5kb fragment from TcLr45 was cloned and sequenced. Subsequently a pair of specific primers (LRYR, LRYF) were designed for the amplifying F2 population derived from TcLr45×Thatcher, and then linkage was analyzed between the marker and Lr45. 【Result】 A unique band was obtained only in TcLr45 with a length of 1 272 bp. And the marker was named as Ypsc20H1272. The linkage distance of the SCAR marker with Lr45 was 8.2 cM.【Conclusion】 The RAPD marker was successfully converted into a SCAR marker for Lr45.

Key words: Secale cereale, leaf rust resistance gene, Lr45, SCAR marker

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