Abstract: 【Objective】The objective of this study was to dissect quantitative trait loci (QTLs) controlling yield traits on the short arm of rice chromosome 6.【Method】A residual heterozygous line for interval RM587-RM19784 on the short arm of rice chromosome 6 was selected from Zhenshan 97B/Milyang 46 recombinant inbred population. An F2:3 population of 221 lines was derived and grown in two trial sites. Six yield traits, number of panicles per plant, number of filled grains per panicle, total number of spikelets per panicle, spikelet fertility, 1000-grain weight and grain yield per plant, were measured. A SSR marker linkage map was constructed and employed to detect QTLs for yield traits with Windows QTL Cartographer 2.5.【Result】QTLs were detected for each of the traits except panicle number, with phenotypic variance explained by a single QTL ranging as 6.3~35.2%. Most of the QTLs for yield components acted as additive QTLs, while the three QTLs for grain yield had dominance degrees of 1.65, 0.84 and –0.42, respectively. 【Conclusion】Three or more QTLs for yield traits were located in the target region. The genetic action mode, the direction of QTL effect and the magnitude of QTL effect sometimes varied among different QTLs for a given trait, and among QTLs for different traits that were located in a same interval.

Key words: Yield traits, Residual heterozygous line (RHL), Quantitative trait locus (QTL), Short arm of chromosome 6, Rice（Oryza sativa L.）